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مشاهده‌ مشخصات مقاله

Dynamic Strength Scaling for Delay Fault Propagation in Nanometer Technologies

Authors
  • Reza Javaheri
  • Reza Sedaghat
Conference چهاردهمین کنفرانس بین‌المللی سالانه انجمن کامپیوتر ایران
Abstract This paper proposes an algorithm for the detection of resistive delay faults in deep submicron technology using dynamic strength scaling, which is applicable for 45 nm and below. The approach uses an advanced coding system to build logical functions that are sensitive to strength and able to detect even the slightest voltage changes in the circuit. Such changes are caused by interconnection resistive behavior and result in timing-related defects.
قیمت
  • برای اعضای سایت : 100,000 Rial
  • برای دانشجویان عضو انجمن : 20,000 Rial
  • برای اعضای عادی انجمن : 40,000 Rial

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