مشاهده مشخصات مقاله
A2CM2: Aging-Aware Cache Memory Management Technique
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نویسنده (ها) |
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Reza Nazari
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Nezam Rohbani
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Hamed Farbeh
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Zahra Shirmohammadi
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Seyed Ghassem Miremadi
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مربوط به کنفرانس |
سمپوزیوم سیستمها و فنآوریهای بیدرنگ و نهفته RTEST 2015 |
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چکیده |
Negative Bias Temperature Instability (NBTI) in CMOS devices is known as the major source of aging effect which is leading to performance and reliability degradation in modern processors. Instruction-cache (I-cache), which has a decisive role in performance and reliability of the processor, is one of the most prone modules to NBTI. Variations in duty cycle and long-time residency of data blocks in I-cache lines (stress condition) are the two major causes of NBTI acceleration. This paper proposes a novel I-cache management technique to minimize the aging effect in the I-cache SRAM cells. The proposed technique consists of a smart controller that monitors the cache lines behavior and distributes uniformly stress condition for each line. The simulation results show that the proposed technique reduces the NBTI effect in I-cache significantly as compared to normal operation. Moreover, the energy consumption and the performance overheads of the proposed technique are negligible. |
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قیمت |
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برای اعضای سایت : ۱٠٠,٠٠٠ ریال
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برای دانشجویان عضو انجمن : ۲٠,٠٠٠ ریال
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برای اعضای عادی انجمن : ۴٠,٠٠٠ ریال
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خرید مقاله
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